AlN nanostructures were fabricated and then MOVPE regrowth experiments were performed upon different regrown nanostructures. The data taken in the main text was in the form of SEM images. Other than figure 5, these were taken with a Hitachi Field-Emission S-4300 SE using a 5 kV electron beam using secondary electron detection. Figure 5 was taken with a FEI Quanta 250 variable pressure SEM, again detecting the secondary electron signal. The AFM images in the supplementary information were taken using a Bruker multimode IIIA AFM, utilising high resolution, high aspect ratio AFM tips.